Single Event Burnout Testing of Power Electronics Devices

The topic of single event burnout (SEB) testing in power electronics devices, particularly in space applications, is crucial to ensure reliable and safe operation. The discussion highlights that SEB can occur at significantly lower voltages than electrical breakdown, often around half or less of the electrical breakdown voltage. This means that using a device with a higher breakdown voltage does not necessarily guarantee its reliability in space environments. In fact, derating devices by increasing their breakdown voltage may result in significant performance losses.
The importance of understanding the relationship between epithickness and single event breakdown is emphasized, as it can provide valuable insights for deploying devices in space. However, this relationship is not quantifiable globally or fundamentally, making it challenging to determine a safe operating area for power electronics devices in space. The discussion also touches on the maturity of technology, experimental conditions, and latent defects that can affect SEB testing results. Overall, the material underscores the need for careful consideration and advanced testing techniques to ensure the reliability and safety of power electronics devices in space applications.