Professor Ron Schrimpf of Vanderbilt University delivered this lecture for the Introduction to Radiation Effects Engineering online SCALE course.
Radiation effects on electronic components demand a hierarchical modeling approach that links fundamental physics to the performance of complex engineered systems. Understanding how ionizing particles interact with semiconductor materials and propagate through device, circuit, and system levels is essential for guaranteeing the reliability of space‑borne, aerospace, and automotive electronics operating in harsh radiation environments. This resource presents a comprehensive view of that multi‑scale perspective.
The discussion traverses the full abstraction ladder, beginning with atomic‑scale quantum mechanics (Schrödinger’s equation) and material band structures that define energy‑momentum relationships in silicon, silicon‑carbide, and oxides. At the device level, band diagrams and Poisson’s equation provide the core framework for analyzing charge distribution and field effects within transistors, while TCAD simulations visualize spatially resolved quantities. Compact models derived from these physics feed electronic‑design‑automation (EDA) tools that enforce Kirchhoff’s laws across circuits, and Boolean algebra captures logical behavior at the gate‑level.
System‑level reliability is then assessed by integrating radiation environment spectra with performance degradation metrics, enabling quantitative predictions of survivability for satellites, aircraft, and power‑MOSFET modules.
Armed with this knowledge, learners can articulate how radiation effects are modeled consistently from component to system, contrast device‑level and system‑level reliability considerations, and employ band diagrams, Poisson’s equation, and energy‑momentum relationships in radiation‑effects analyses. They are equipped to evaluate the impact of a given radiation environment on semiconductor device survivability, thereby informing design decisions that ensure functional integrity of high‑reliability systems.